Reflector (TM-polarization)
SEM of LWIR reflector device (left), a close-up of device structure (right), and photograph of the device (inset).
Measured zero-order TM transmission spectrum and the calculated zero-order reflectance of LWIR reflector device.
2D Notch filter
Photograph (left) and AFM image (right) of 2D guided mode resonance (GMR) notch filter device operating in infrared region (8-12 μm).
The functionality of the filter is improved by adding AR (anti-reflection) layer.
Band stop filter with high OD
SEM of 1D band stop filter device, and photograph of the device (inset).
Calculated and measured spectrum of fabricated device on logarithmic scale for normally incident TM-polarized LWIR light with optical density (OD) = 3.68.
Band stop filter -2D
2D band stop filter device (inset). Measured spectrum of fabricated device on linear scale (left) and logarithmic scale (right) for normally incident unpolarized LWIR light.
Developing Technologies
